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Název:		Metrics for HighQuality Specular Surfaces (SPIE Tutorial Texts in Optical Engineering Vol. TT65)
Autor:
Rok vydání:		2004
Identifikátory:		9780819455765

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Anotace:	This book supplies the optical component and systems designer, and quality assurance engineers and managers with the definitions, measurement principles, and standard metrics used to characterize high-quality specular surfaces. The author covers both the traditional visual methods as well as newer (but not necessarily better) computer-aided techniques and describes the metrics adopted by the new ISO standards, including the setting of form and finish tolerances. Key issues of industry are raised, to help stimulate research and development of new methods and standards that blend the best of the old and new approaches to surface assessment.<p><b>Contents</b><p> - Preface<br> - List of abbreviations<br> - List of symbols<br> - Surface Metrics<br> - Surface Form<br> - Surface Roughness<br> - Surface Waviness<br> - Surface Imperfections<br> - Measurement of Imperfections by Obscuration<br> - Surface Imperfection Quality Control<br> - Far-Field Nanoscopy<br> - Strip Product Inspection<br> - Appendix 1: Quality metrics for digital cameras<br> - Appendix 2: Surface cleaning<br> - Glossary<br> - Contacts and Further Reading<br> - Index
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